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24 May 2019

HEUFT examiner II XB: simply more precise!

The HEUFT eXaminer II XB in a blister line-

Minute foreign particles in pharmaceutical products and packaging, incomplete or incorrectly filled blister packs and bent cannulas: the optimised HEUFT eXaminer II XB now identifies safety and quality defects such as these even more precisely!

It is the only top-down inspector to combine the pulsed X-ray technology available exclusively from HEUFT with compact full-field image converters.

The new HEUFT SPECTRUM II device platform provides a considerable increase in computing power and automation and at the same time tracks products with millimetre accuracy. The audiovisual HEUFT NaVi user guidance makes the system self-explanatory. And the HEUFT reflexx² real-time image processing with teaching in capability clearly differentiates between harmless irregularities and critical faults.

The result: considerably more range as well as detection, rejection and operational reliability during the in-line inspection of filled pharmaceutical primary packaging. The unique combination of pulsed X-ray technology with smart multiple flash option and optimally arranged full-field image converters extends the sensitive detection surface of the HEUFT eXaminer II XB at a higher resolution. Larger products can also be inspected continuously in this way. The extremely clear detection pictures remain free of distortions and image defects even in the border areas.

This makes the detection of contaminated, damaged or incomplete pharmaceutical packaging even more precise. It will be shown at CPhi how reliably the HEUFT eXaminer II XB detects glass splinters, metal particles and other high-density foreign objects in the tablets in blister packs – as well as product defects and incompleteness in the cavities. Furthermore the top-down inspector will be also used to demonstrate the detection reliability of the slim HEUFT Syringer module when identifying pre-filled syringes with contaminants, bent cannulas or pierced protective covers.

The X-ray parameters adapted to the new image converter technology reduce the already unequalled low radiation. In contrast to conventional scans it is emitted as X-ray flashes which only last a thousandth of a second. And only then when there is really something to be inspected. The flashing prevents motion blurs at high conveyor speeds which can impair the detection reliability. The multiple flash option carries out a complete check of particularly long products.

The pulsed X-ray technology, available exclusively from HEUFT, makes the worldwide unique use of the compact image converters in inspection systems possible in the first place. The high-voltage components and X-ray generators have also been optimised. The result: more compact devices with considerably more scope and flexibility when adapting the conveyor for the reliable inspection of products of different heights. Further improvements reduce and simplify the maintenance of the top-down inspector constructed in accordance with the hygiene-optimised HEUFT CleanDesign.

The highly automated system of the HEUFT SPECTRUM II generation with the self-explanatory, tamper-proof HEUFT NaVi user guidance is easy to operate and space-saving and efficient as a linear machine. A protected online connection enables secure real-time transmission, the preparation and complete archiving of batch and production data, test container and Knapp test logs, a reliable audit trail documentation and targeted remote maintenance with the HEUFT TeleService. The HEUFT eXaminer II XB fulfils fundamental FDA, GMP, GAMP5 and 21 CFR Part 11 requirements reliably.

Mentioned Companies
HEUFT Systemtechnik GMBH
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